Components
3
Twig Components
5
Render Count
2
ms
Render Time
74.0
MiB
Memory Usage
Components
| Name | Metadata | Render Count | Render Time |
|---|---|---|---|
| ProductState |
"App\Twig\Components\ProductState"components/ProductState.html.twig |
2 | 0.60ms |
| ProductMostRecent |
"App\Twig\Components\ProductMostRecent"components/ProductMostRecent.html.twig |
2 | 1.54ms |
| ProductType |
"App\Twig\Components\ProductType"components/ProductType.html.twig |
1 | 0.26ms |
Render calls
| ProductState | App\Twig\Components\ProductState | 66.0 MiB | 0.39 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#7310 #id: 11237 #code: "IEEE00005786" #attributes: Doctrine\ORM\PersistentCollection {#7700 …} #variants: Doctrine\ORM\PersistentCollection {#7743 …} #options: Doctrine\ORM\PersistentCollection {#7915 …} #associations: Doctrine\ORM\PersistentCollection {#7899 …} #createdAt: DateTime @1751039566 {#7274 : 2025-06-27 17:52:46.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1753969918 {#7322 : 2025-07-31 15:51:58.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7921 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7920 #locale: "en_US" #translatable: App\Entity\Product\Product {#7310} #id: 39957 #name: "IEEE 1149.10:2017" #slug: "ieee-1149-10-2017-ieee00005786-242889" #description: """ New IEEE Standard - Active.<br />\n Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards, assembled multi-die packages, and the test of die internal circuits is defined in this standard. The circuitry includes a high-speed TAP (HSTAP) with a packet encoder/decoder and distribution architecture through which instructions and test data are communicated. The standard leverages the languages of IEEE Std 1149.1™ to describe and operate the on-chip circuits.<br />\n \t\t\t\t<br />\n This standard defines a high speed test access port for delivery of test data, a packet format for describing the test payload, and a distribution architecture for converting the test data to/from on-chip test structures.<br />\n The standard re-uses existing high speed I/O (HSIO) known in the industry for the high speed test access port (HSTAP). The HSIO connects to an on-chip distribution architecture through a common interface. The scope includes the distribution architecture test logic and packet decoder logic. The objective of the distribution architecture and packet decoder is that it can be readily re-used with different integrated circuits (ICs) that host different HSIO technology, such that the standard addresses as large a part of the industry as possible.<br />\n The scope includes IEEE 1149.1 Boundary-Scan Description Language (BSDL) and Procedural Description Language (PDL) documentation, which can be used for configuring a mission mode HSIO to a test mode compatible with the HSTAP. The same BSDL and PDL can then be used to deliver high-speed data to the on-chip test structures. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for High-Speed Test Access Port and On-Chip Distribution Architecture" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …} #channels: Doctrine\ORM\PersistentCollection {#7627 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …} #reviews: Doctrine\ORM\PersistentCollection {#7612 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7644 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …} -apiLastModifiedAt: DateTime @1743289200 {#7317 : 2025-03-30 00:00:00.0 Europe/Paris (+01:00) } -lastUpdatedAt: DateTime @1630360800 {#7292 : 2021-08-31 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1501192800 {#7318 : 2017-07-28 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1149.10" -bookCollection: "" -pageCount: 96 -documents: Doctrine\ORM\PersistentCollection {#7464 …} -favorites: Doctrine\ORM\PersistentCollection {#7499 …} } "showFullLabel" => "true" ] |
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| Attributes | [ "showFullLabel" => "true" ] |
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| Component | App\Twig\Components\ProductState {#93066 +product: App\Entity\Product\Product {#7310 #id: 11237 #code: "IEEE00005786" #attributes: Doctrine\ORM\PersistentCollection {#7700 …} #variants: Doctrine\ORM\PersistentCollection {#7743 …} #options: Doctrine\ORM\PersistentCollection {#7915 …} #associations: Doctrine\ORM\PersistentCollection {#7899 …} #createdAt: DateTime @1751039566 {#7274 : 2025-06-27 17:52:46.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1753969918 {#7322 : 2025-07-31 15:51:58.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7921 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7920 #locale: "en_US" #translatable: App\Entity\Product\Product {#7310} #id: 39957 #name: "IEEE 1149.10:2017" #slug: "ieee-1149-10-2017-ieee00005786-242889" #description: """ New IEEE Standard - Active.<br />\n Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards, assembled multi-die packages, and the test of die internal circuits is defined in this standard. The circuitry includes a high-speed TAP (HSTAP) with a packet encoder/decoder and distribution architecture through which instructions and test data are communicated. The standard leverages the languages of IEEE Std 1149.1™ to describe and operate the on-chip circuits.<br />\n \t\t\t\t<br />\n This standard defines a high speed test access port for delivery of test data, a packet format for describing the test payload, and a distribution architecture for converting the test data to/from on-chip test structures.<br />\n The standard re-uses existing high speed I/O (HSIO) known in the industry for the high speed test access port (HSTAP). The HSIO connects to an on-chip distribution architecture through a common interface. The scope includes the distribution architecture test logic and packet decoder logic. The objective of the distribution architecture and packet decoder is that it can be readily re-used with different integrated circuits (ICs) that host different HSIO technology, such that the standard addresses as large a part of the industry as possible.<br />\n The scope includes IEEE 1149.1 Boundary-Scan Description Language (BSDL) and Procedural Description Language (PDL) documentation, which can be used for configuring a mission mode HSIO to a test mode compatible with the HSTAP. The same BSDL and PDL can then be used to deliver high-speed data to the on-chip test structures. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for High-Speed Test Access Port and On-Chip Distribution Architecture" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …} #channels: Doctrine\ORM\PersistentCollection {#7627 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …} #reviews: Doctrine\ORM\PersistentCollection {#7612 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7644 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …} -apiLastModifiedAt: DateTime @1743289200 {#7317 : 2025-03-30 00:00:00.0 Europe/Paris (+01:00) } -lastUpdatedAt: DateTime @1630360800 {#7292 : 2021-08-31 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1501192800 {#7318 : 2017-07-28 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1149.10" -bookCollection: "" -pageCount: 96 -documents: Doctrine\ORM\PersistentCollection {#7464 …} -favorites: Doctrine\ORM\PersistentCollection {#7499 …} } +appearance: "state-active" +labels: [ "Active" ] -stateAttributeCode: "state" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductType | App\Twig\Components\ProductType | 68.0 MiB | 0.26 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#7310 #id: 11237 #code: "IEEE00005786" #attributes: Doctrine\ORM\PersistentCollection {#7700 …} #variants: Doctrine\ORM\PersistentCollection {#7743 …} #options: Doctrine\ORM\PersistentCollection {#7915 …} #associations: Doctrine\ORM\PersistentCollection {#7899 …} #createdAt: DateTime @1751039566 {#7274 : 2025-06-27 17:52:46.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1753969918 {#7322 : 2025-07-31 15:51:58.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7921 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7920 #locale: "en_US" #translatable: App\Entity\Product\Product {#7310} #id: 39957 #name: "IEEE 1149.10:2017" #slug: "ieee-1149-10-2017-ieee00005786-242889" #description: """ New IEEE Standard - Active.<br />\n Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards, assembled multi-die packages, and the test of die internal circuits is defined in this standard. The circuitry includes a high-speed TAP (HSTAP) with a packet encoder/decoder and distribution architecture through which instructions and test data are communicated. The standard leverages the languages of IEEE Std 1149.1™ to describe and operate the on-chip circuits.<br />\n \t\t\t\t<br />\n This standard defines a high speed test access port for delivery of test data, a packet format for describing the test payload, and a distribution architecture for converting the test data to/from on-chip test structures.<br />\n The standard re-uses existing high speed I/O (HSIO) known in the industry for the high speed test access port (HSTAP). The HSIO connects to an on-chip distribution architecture through a common interface. The scope includes the distribution architecture test logic and packet decoder logic. The objective of the distribution architecture and packet decoder is that it can be readily re-used with different integrated circuits (ICs) that host different HSIO technology, such that the standard addresses as large a part of the industry as possible.<br />\n The scope includes IEEE 1149.1 Boundary-Scan Description Language (BSDL) and Procedural Description Language (PDL) documentation, which can be used for configuring a mission mode HSIO to a test mode compatible with the HSTAP. The same BSDL and PDL can then be used to deliver high-speed data to the on-chip test structures. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for High-Speed Test Access Port and On-Chip Distribution Architecture" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …} #channels: Doctrine\ORM\PersistentCollection {#7627 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …} #reviews: Doctrine\ORM\PersistentCollection {#7612 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7644 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …} -apiLastModifiedAt: DateTime @1743289200 {#7317 : 2025-03-30 00:00:00.0 Europe/Paris (+01:00) } -lastUpdatedAt: DateTime @1630360800 {#7292 : 2021-08-31 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1501192800 {#7318 : 2017-07-28 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1149.10" -bookCollection: "" -pageCount: 96 -documents: Doctrine\ORM\PersistentCollection {#7464 …} -favorites: Doctrine\ORM\PersistentCollection {#7499 …} } ] |
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| Attributes | [] |
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| Component | App\Twig\Components\ProductType {#93246 +product: App\Entity\Product\Product {#7310 #id: 11237 #code: "IEEE00005786" #attributes: Doctrine\ORM\PersistentCollection {#7700 …} #variants: Doctrine\ORM\PersistentCollection {#7743 …} #options: Doctrine\ORM\PersistentCollection {#7915 …} #associations: Doctrine\ORM\PersistentCollection {#7899 …} #createdAt: DateTime @1751039566 {#7274 : 2025-06-27 17:52:46.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1753969918 {#7322 : 2025-07-31 15:51:58.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7921 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7920 #locale: "en_US" #translatable: App\Entity\Product\Product {#7310} #id: 39957 #name: "IEEE 1149.10:2017" #slug: "ieee-1149-10-2017-ieee00005786-242889" #description: """ New IEEE Standard - Active.<br />\n Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards, assembled multi-die packages, and the test of die internal circuits is defined in this standard. The circuitry includes a high-speed TAP (HSTAP) with a packet encoder/decoder and distribution architecture through which instructions and test data are communicated. The standard leverages the languages of IEEE Std 1149.1™ to describe and operate the on-chip circuits.<br />\n \t\t\t\t<br />\n This standard defines a high speed test access port for delivery of test data, a packet format for describing the test payload, and a distribution architecture for converting the test data to/from on-chip test structures.<br />\n The standard re-uses existing high speed I/O (HSIO) known in the industry for the high speed test access port (HSTAP). The HSIO connects to an on-chip distribution architecture through a common interface. The scope includes the distribution architecture test logic and packet decoder logic. The objective of the distribution architecture and packet decoder is that it can be readily re-used with different integrated circuits (ICs) that host different HSIO technology, such that the standard addresses as large a part of the industry as possible.<br />\n The scope includes IEEE 1149.1 Boundary-Scan Description Language (BSDL) and Procedural Description Language (PDL) documentation, which can be used for configuring a mission mode HSIO to a test mode compatible with the HSTAP. The same BSDL and PDL can then be used to deliver high-speed data to the on-chip test structures. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for High-Speed Test Access Port and On-Chip Distribution Architecture" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …} #channels: Doctrine\ORM\PersistentCollection {#7627 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …} #reviews: Doctrine\ORM\PersistentCollection {#7612 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7644 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …} -apiLastModifiedAt: DateTime @1743289200 {#7317 : 2025-03-30 00:00:00.0 Europe/Paris (+01:00) } -lastUpdatedAt: DateTime @1630360800 {#7292 : 2021-08-31 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1501192800 {#7318 : 2017-07-28 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1149.10" -bookCollection: "" -pageCount: 96 -documents: Doctrine\ORM\PersistentCollection {#7464 …} -favorites: Doctrine\ORM\PersistentCollection {#7499 …} } +label: "Standard" -typeAttributeCode: "type" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductMostRecent | App\Twig\Components\ProductMostRecent | 68.0 MiB | 0.78 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#7310 #id: 11237 #code: "IEEE00005786" #attributes: Doctrine\ORM\PersistentCollection {#7700 …} #variants: Doctrine\ORM\PersistentCollection {#7743 …} #options: Doctrine\ORM\PersistentCollection {#7915 …} #associations: Doctrine\ORM\PersistentCollection {#7899 …} #createdAt: DateTime @1751039566 {#7274 : 2025-06-27 17:52:46.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1753969918 {#7322 : 2025-07-31 15:51:58.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7921 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7920 #locale: "en_US" #translatable: App\Entity\Product\Product {#7310} #id: 39957 #name: "IEEE 1149.10:2017" #slug: "ieee-1149-10-2017-ieee00005786-242889" #description: """ New IEEE Standard - Active.<br />\n Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards, assembled multi-die packages, and the test of die internal circuits is defined in this standard. The circuitry includes a high-speed TAP (HSTAP) with a packet encoder/decoder and distribution architecture through which instructions and test data are communicated. The standard leverages the languages of IEEE Std 1149.1™ to describe and operate the on-chip circuits.<br />\n \t\t\t\t<br />\n This standard defines a high speed test access port for delivery of test data, a packet format for describing the test payload, and a distribution architecture for converting the test data to/from on-chip test structures.<br />\n The standard re-uses existing high speed I/O (HSIO) known in the industry for the high speed test access port (HSTAP). The HSIO connects to an on-chip distribution architecture through a common interface. The scope includes the distribution architecture test logic and packet decoder logic. The objective of the distribution architecture and packet decoder is that it can be readily re-used with different integrated circuits (ICs) that host different HSIO technology, such that the standard addresses as large a part of the industry as possible.<br />\n The scope includes IEEE 1149.1 Boundary-Scan Description Language (BSDL) and Procedural Description Language (PDL) documentation, which can be used for configuring a mission mode HSIO to a test mode compatible with the HSTAP. The same BSDL and PDL can then be used to deliver high-speed data to the on-chip test structures. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for High-Speed Test Access Port and On-Chip Distribution Architecture" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …} #channels: Doctrine\ORM\PersistentCollection {#7627 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …} #reviews: Doctrine\ORM\PersistentCollection {#7612 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7644 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …} -apiLastModifiedAt: DateTime @1743289200 {#7317 : 2025-03-30 00:00:00.0 Europe/Paris (+01:00) } -lastUpdatedAt: DateTime @1630360800 {#7292 : 2021-08-31 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1501192800 {#7318 : 2017-07-28 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1149.10" -bookCollection: "" -pageCount: 96 -documents: Doctrine\ORM\PersistentCollection {#7464 …} -favorites: Doctrine\ORM\PersistentCollection {#7499 …} } ] |
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| Attributes | [] |
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| Component | App\Twig\Components\ProductMostRecent {#93321 +product: App\Entity\Product\Product {#7310 #id: 11237 #code: "IEEE00005786" #attributes: Doctrine\ORM\PersistentCollection {#7700 …} #variants: Doctrine\ORM\PersistentCollection {#7743 …} #options: Doctrine\ORM\PersistentCollection {#7915 …} #associations: Doctrine\ORM\PersistentCollection {#7899 …} #createdAt: DateTime @1751039566 {#7274 : 2025-06-27 17:52:46.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1753969918 {#7322 : 2025-07-31 15:51:58.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7921 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7920 #locale: "en_US" #translatable: App\Entity\Product\Product {#7310} #id: 39957 #name: "IEEE 1149.10:2017" #slug: "ieee-1149-10-2017-ieee00005786-242889" #description: """ New IEEE Standard - Active.<br />\n Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards, assembled multi-die packages, and the test of die internal circuits is defined in this standard. The circuitry includes a high-speed TAP (HSTAP) with a packet encoder/decoder and distribution architecture through which instructions and test data are communicated. The standard leverages the languages of IEEE Std 1149.1™ to describe and operate the on-chip circuits.<br />\n \t\t\t\t<br />\n This standard defines a high speed test access port for delivery of test data, a packet format for describing the test payload, and a distribution architecture for converting the test data to/from on-chip test structures.<br />\n The standard re-uses existing high speed I/O (HSIO) known in the industry for the high speed test access port (HSTAP). The HSIO connects to an on-chip distribution architecture through a common interface. The scope includes the distribution architecture test logic and packet decoder logic. The objective of the distribution architecture and packet decoder is that it can be readily re-used with different integrated circuits (ICs) that host different HSIO technology, such that the standard addresses as large a part of the industry as possible.<br />\n The scope includes IEEE 1149.1 Boundary-Scan Description Language (BSDL) and Procedural Description Language (PDL) documentation, which can be used for configuring a mission mode HSIO to a test mode compatible with the HSTAP. The same BSDL and PDL can then be used to deliver high-speed data to the on-chip test structures. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for High-Speed Test Access Port and On-Chip Distribution Architecture" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …} #channels: Doctrine\ORM\PersistentCollection {#7627 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …} #reviews: Doctrine\ORM\PersistentCollection {#7612 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7644 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …} -apiLastModifiedAt: DateTime @1743289200 {#7317 : 2025-03-30 00:00:00.0 Europe/Paris (+01:00) } -lastUpdatedAt: DateTime @1630360800 {#7292 : 2021-08-31 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1501192800 {#7318 : 2017-07-28 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1149.10" -bookCollection: "" -pageCount: 96 -documents: Doctrine\ORM\PersistentCollection {#7464 …} -favorites: Doctrine\ORM\PersistentCollection {#7499 …} } +label: "Most Recent" +icon: "check-xs" -mostRecentAttributeCode: "most_recent" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
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| ProductState | App\Twig\Components\ProductState | 74.0 MiB | 0.21 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#7310 #id: 11237 #code: "IEEE00005786" #attributes: Doctrine\ORM\PersistentCollection {#7700 …} #variants: Doctrine\ORM\PersistentCollection {#7743 …} #options: Doctrine\ORM\PersistentCollection {#7915 …} #associations: Doctrine\ORM\PersistentCollection {#7899 …} #createdAt: DateTime @1751039566 {#7274 : 2025-06-27 17:52:46.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1753969918 {#7322 : 2025-07-31 15:51:58.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7921 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7920 #locale: "en_US" #translatable: App\Entity\Product\Product {#7310} #id: 39957 #name: "IEEE 1149.10:2017" #slug: "ieee-1149-10-2017-ieee00005786-242889" #description: """ New IEEE Standard - Active.<br />\n Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards, assembled multi-die packages, and the test of die internal circuits is defined in this standard. The circuitry includes a high-speed TAP (HSTAP) with a packet encoder/decoder and distribution architecture through which instructions and test data are communicated. The standard leverages the languages of IEEE Std 1149.1™ to describe and operate the on-chip circuits.<br />\n \t\t\t\t<br />\n This standard defines a high speed test access port for delivery of test data, a packet format for describing the test payload, and a distribution architecture for converting the test data to/from on-chip test structures.<br />\n The standard re-uses existing high speed I/O (HSIO) known in the industry for the high speed test access port (HSTAP). The HSIO connects to an on-chip distribution architecture through a common interface. The scope includes the distribution architecture test logic and packet decoder logic. The objective of the distribution architecture and packet decoder is that it can be readily re-used with different integrated circuits (ICs) that host different HSIO technology, such that the standard addresses as large a part of the industry as possible.<br />\n The scope includes IEEE 1149.1 Boundary-Scan Description Language (BSDL) and Procedural Description Language (PDL) documentation, which can be used for configuring a mission mode HSIO to a test mode compatible with the HSTAP. The same BSDL and PDL can then be used to deliver high-speed data to the on-chip test structures. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for High-Speed Test Access Port and On-Chip Distribution Architecture" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …} #channels: Doctrine\ORM\PersistentCollection {#7627 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …} #reviews: Doctrine\ORM\PersistentCollection {#7612 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7644 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …} -apiLastModifiedAt: DateTime @1743289200 {#7317 : 2025-03-30 00:00:00.0 Europe/Paris (+01:00) } -lastUpdatedAt: DateTime @1630360800 {#7292 : 2021-08-31 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1501192800 {#7318 : 2017-07-28 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1149.10" -bookCollection: "" -pageCount: 96 -documents: Doctrine\ORM\PersistentCollection {#7464 …} -favorites: Doctrine\ORM\PersistentCollection {#7499 …} } "showFullLabel" => "true" ] |
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| Attributes | [ "showFullLabel" => "true" ] |
|||
| Component | App\Twig\Components\ProductState {#100264 +product: App\Entity\Product\Product {#7310 #id: 11237 #code: "IEEE00005786" #attributes: Doctrine\ORM\PersistentCollection {#7700 …} #variants: Doctrine\ORM\PersistentCollection {#7743 …} #options: Doctrine\ORM\PersistentCollection {#7915 …} #associations: Doctrine\ORM\PersistentCollection {#7899 …} #createdAt: DateTime @1751039566 {#7274 : 2025-06-27 17:52:46.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1753969918 {#7322 : 2025-07-31 15:51:58.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7921 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7920 #locale: "en_US" #translatable: App\Entity\Product\Product {#7310} #id: 39957 #name: "IEEE 1149.10:2017" #slug: "ieee-1149-10-2017-ieee00005786-242889" #description: """ New IEEE Standard - Active.<br />\n Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards, assembled multi-die packages, and the test of die internal circuits is defined in this standard. The circuitry includes a high-speed TAP (HSTAP) with a packet encoder/decoder and distribution architecture through which instructions and test data are communicated. The standard leverages the languages of IEEE Std 1149.1™ to describe and operate the on-chip circuits.<br />\n \t\t\t\t<br />\n This standard defines a high speed test access port for delivery of test data, a packet format for describing the test payload, and a distribution architecture for converting the test data to/from on-chip test structures.<br />\n The standard re-uses existing high speed I/O (HSIO) known in the industry for the high speed test access port (HSTAP). The HSIO connects to an on-chip distribution architecture through a common interface. The scope includes the distribution architecture test logic and packet decoder logic. The objective of the distribution architecture and packet decoder is that it can be readily re-used with different integrated circuits (ICs) that host different HSIO technology, such that the standard addresses as large a part of the industry as possible.<br />\n The scope includes IEEE 1149.1 Boundary-Scan Description Language (BSDL) and Procedural Description Language (PDL) documentation, which can be used for configuring a mission mode HSIO to a test mode compatible with the HSTAP. The same BSDL and PDL can then be used to deliver high-speed data to the on-chip test structures. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for High-Speed Test Access Port and On-Chip Distribution Architecture" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …} #channels: Doctrine\ORM\PersistentCollection {#7627 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …} #reviews: Doctrine\ORM\PersistentCollection {#7612 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7644 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …} -apiLastModifiedAt: DateTime @1743289200 {#7317 : 2025-03-30 00:00:00.0 Europe/Paris (+01:00) } -lastUpdatedAt: DateTime @1630360800 {#7292 : 2021-08-31 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1501192800 {#7318 : 2017-07-28 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1149.10" -bookCollection: "" -pageCount: 96 -documents: Doctrine\ORM\PersistentCollection {#7464 …} -favorites: Doctrine\ORM\PersistentCollection {#7499 …} } +appearance: "state-active" +labels: [ "Active" ] -stateAttributeCode: "state" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
|||
| ProductMostRecent | App\Twig\Components\ProductMostRecent | 74.0 MiB | 0.77 ms | |
|---|---|---|---|---|
| Input props | [ "product" => App\Entity\Product\Product {#7310 #id: 11237 #code: "IEEE00005786" #attributes: Doctrine\ORM\PersistentCollection {#7700 …} #variants: Doctrine\ORM\PersistentCollection {#7743 …} #options: Doctrine\ORM\PersistentCollection {#7915 …} #associations: Doctrine\ORM\PersistentCollection {#7899 …} #createdAt: DateTime @1751039566 {#7274 : 2025-06-27 17:52:46.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1753969918 {#7322 : 2025-07-31 15:51:58.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7921 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7920 #locale: "en_US" #translatable: App\Entity\Product\Product {#7310} #id: 39957 #name: "IEEE 1149.10:2017" #slug: "ieee-1149-10-2017-ieee00005786-242889" #description: """ New IEEE Standard - Active.<br />\n Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards, assembled multi-die packages, and the test of die internal circuits is defined in this standard. The circuitry includes a high-speed TAP (HSTAP) with a packet encoder/decoder and distribution architecture through which instructions and test data are communicated. The standard leverages the languages of IEEE Std 1149.1™ to describe and operate the on-chip circuits.<br />\n \t\t\t\t<br />\n This standard defines a high speed test access port for delivery of test data, a packet format for describing the test payload, and a distribution architecture for converting the test data to/from on-chip test structures.<br />\n The standard re-uses existing high speed I/O (HSIO) known in the industry for the high speed test access port (HSTAP). The HSIO connects to an on-chip distribution architecture through a common interface. The scope includes the distribution architecture test logic and packet decoder logic. The objective of the distribution architecture and packet decoder is that it can be readily re-used with different integrated circuits (ICs) that host different HSIO technology, such that the standard addresses as large a part of the industry as possible.<br />\n The scope includes IEEE 1149.1 Boundary-Scan Description Language (BSDL) and Procedural Description Language (PDL) documentation, which can be used for configuring a mission mode HSIO to a test mode compatible with the HSTAP. The same BSDL and PDL can then be used to deliver high-speed data to the on-chip test structures. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for High-Speed Test Access Port and On-Chip Distribution Architecture" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …} #channels: Doctrine\ORM\PersistentCollection {#7627 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …} #reviews: Doctrine\ORM\PersistentCollection {#7612 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7644 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …} -apiLastModifiedAt: DateTime @1743289200 {#7317 : 2025-03-30 00:00:00.0 Europe/Paris (+01:00) } -lastUpdatedAt: DateTime @1630360800 {#7292 : 2021-08-31 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1501192800 {#7318 : 2017-07-28 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1149.10" -bookCollection: "" -pageCount: 96 -documents: Doctrine\ORM\PersistentCollection {#7464 …} -favorites: Doctrine\ORM\PersistentCollection {#7499 …} } ] |
|||
| Attributes | [] |
|||
| Component | App\Twig\Components\ProductMostRecent {#100348 +product: App\Entity\Product\Product {#7310 #id: 11237 #code: "IEEE00005786" #attributes: Doctrine\ORM\PersistentCollection {#7700 …} #variants: Doctrine\ORM\PersistentCollection {#7743 …} #options: Doctrine\ORM\PersistentCollection {#7915 …} #associations: Doctrine\ORM\PersistentCollection {#7899 …} #createdAt: DateTime @1751039566 {#7274 : 2025-06-27 17:52:46.0 Europe/Paris (+02:00) } #updatedAt: DateTime @1753969918 {#7322 : 2025-07-31 15:51:58.0 Europe/Paris (+02:00) } #enabled: true #translations: Doctrine\ORM\PersistentCollection {#7921 …} #translationsCache: [ "en_US" => App\Entity\Product\ProductTranslation {#7920 #locale: "en_US" #translatable: App\Entity\Product\Product {#7310} #id: 39957 #name: "IEEE 1149.10:2017" #slug: "ieee-1149-10-2017-ieee00005786-242889" #description: """ New IEEE Standard - Active.<br />\n Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards, assembled multi-die packages, and the test of die internal circuits is defined in this standard. The circuitry includes a high-speed TAP (HSTAP) with a packet encoder/decoder and distribution architecture through which instructions and test data are communicated. The standard leverages the languages of IEEE Std 1149.1™ to describe and operate the on-chip circuits.<br />\n \t\t\t\t<br />\n This standard defines a high speed test access port for delivery of test data, a packet format for describing the test payload, and a distribution architecture for converting the test data to/from on-chip test structures.<br />\n The standard re-uses existing high speed I/O (HSIO) known in the industry for the high speed test access port (HSTAP). The HSIO connects to an on-chip distribution architecture through a common interface. The scope includes the distribution architecture test logic and packet decoder logic. The objective of the distribution architecture and packet decoder is that it can be readily re-used with different integrated circuits (ICs) that host different HSIO technology, such that the standard addresses as large a part of the industry as possible.<br />\n The scope includes IEEE 1149.1 Boundary-Scan Description Language (BSDL) and Procedural Description Language (PDL) documentation, which can be used for configuring a mission mode HSIO to a test mode compatible with the HSTAP. The same BSDL and PDL can then be used to deliver high-speed data to the on-chip test structures. """ #metaKeywords: null #metaDescription: null #shortDescription: "IEEE Standard for High-Speed Test Access Port and On-Chip Distribution Architecture" -notes: "Active" } ] #currentLocale: "en_US" #currentTranslation: null #fallbackLocale: "en_US" #variantSelectionMethod: "match" #productTaxons: Doctrine\ORM\PersistentCollection {#7533 …} #channels: Doctrine\ORM\PersistentCollection {#7627 …} #mainTaxon: Proxies\__CG__\App\Entity\Taxonomy\Taxon {#7311 …} #reviews: Doctrine\ORM\PersistentCollection {#7612 …} #averageRating: 0.0 #images: Doctrine\ORM\PersistentCollection {#7644 …} -supplier: Proxies\__CG__\App\Entity\Supplier\Supplier {#7325 …} -subscriptionCollections: Doctrine\ORM\PersistentCollection {#7389 …} -apiLastModifiedAt: DateTime @1743289200 {#7317 : 2025-03-30 00:00:00.0 Europe/Paris (+01:00) } -lastUpdatedAt: DateTime @1630360800 {#7292 : 2021-08-31 00:00:00.0 Europe/Paris (+02:00) } -author: "" -publishedAt: DateTime @1501192800 {#7318 : 2017-07-28 00:00:00.0 Europe/Paris (+02:00) } -releasedAt: null -confirmedAt: null -canceledAt: null -edition: null -coreDocument: "1149.10" -bookCollection: "" -pageCount: 96 -documents: Doctrine\ORM\PersistentCollection {#7464 …} -favorites: Doctrine\ORM\PersistentCollection {#7499 …} } +label: "Most Recent" +icon: "check-xs" -mostRecentAttributeCode: "most_recent" -localeContext: Sylius\Component\Locale\Context\CompositeLocaleContext {#1833 …} } |
|||